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Impact of the Backgate on the Performance of SOI UTBB nMOSFETs at Cryogenic Temperatures2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon conference-paper Engineering Advancements in Semiconductor Devices and Circuit Design
Yi Han, Fengben Xi, F. Allibert, Ionut Radu, Sławomir Prucnal, Jin Hee Bae, +4 more
11citations
4 results