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Uncovering the human evaluation of changeability for automated factory layout planning: an expert survey2021 Production Engineering article Engineering Advanced Manufacturing and Logistics Optimization Open access
Peter Burggräf, Matthias Dannapfel, Viviane Hahn, Michael Preutenborbeck
13citations -
Determination of a Dedicated, Cost-Effective Agility in Manufacturing Networks2020 Lecture notes in production engineering conference-paper Business, Management and Accounting Collaboration in agile enterprises
Johanna Ays, Andreas Gützlaff, Katharina Thomas, F. Berbecker, Günther Schuh
2citations -
Systematic analysis of snRNA genes reveals frequent RNU2-2 variants in dominant and recessive developmental and epileptic encephalopathies2025 medRxiv preprint Biochemistry, Genetics and Molecular Biology Genetics and Neurodevelopmental Disorders Open access
Elsa Leitão, Benjamin Cogné, Miriam Essid, Maria Athanasiadou, Christy W. LaFlamme, Pierre Marijon, +90 more
9citations -
Systematic analysis of snRNA genes reveals frequent RNU2-2 variants in dominant and recessive developmental and epileptic encephalopathies2026 Nature Genetics article Biochemistry, Genetics and Molecular Biology Genetics and Neurodevelopmental Disorders Open access
Elsa Leitão, Amandine Santini, Benjamin Cogné, Miriam Essid, Maria Athanasiadou, Christy W. LaFlamme, +94 more
7citations -
The dancing trees: objects, facts and ideas in museums. In From Field to Museum—Studies from Melanesia in Honour of Robin Torrence, ed. Jim Specht, Val Attenbrow, and Jim Allen1citations
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SPARSE -- Efficient High-Resolution SEM Imaging of Rare Microstructural Features Across Large Areas by Selective Rescanning2026 arXiv (Cornell University) preprint Materials Science Electron and X-Ray Spectroscopy Techniques Open access
Tom Reclik, Jan Gerlach, Maximilian A. Wollenweber, Yannis P. Korkolis, Sandra Korte‐Kerzel, U. Kerzel
0citations -
SPARSE — Efficient high-resolution SEM imaging of rare microstructural features across large areas by selective rescanning2026 Materials Characterization article Materials Science Electron and X-Ray Spectroscopy Techniques Open access
Tom Reclik, Jan Gerlach, Maximilian A. Wollenweber, Yannis P. Korkolis, Sandra Korte‐Kerzel, U. Kerzel
0citations
21 results