Papers matching “fault simulation” in Radiation Effects in Electronics 2
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Evaluation of Single Event Upset Susceptibility of FinFET-based SRAMs with Weak Resistive Defects2021 Journal of Electronic Testing book-chapter Engineering Radiation Effects in Electronics Open access
T. Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Letícia Bolzani Poehls, Tiago Roberto Balen
6citations
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