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Influence of multiple detection events on compositional accuracy of TiN coatings in atom probe tomography2023 Surface and Coatings Technology article Engineering Advanced Materials Characterization Techniques Open access
Maximilian Schiester, Helene Waldl, Marcus Hans, Mattias Thuvander, Daniel Primetzhofer, Nina Schalk, +1 more
18citations -
An exploration of contrastive self-supervised learning for reconstructed atom probe tomography data2026 Machine Learning Science and Technology article Engineering Advanced Materials Characterization Techniques Open access
Janis A. Sälker, Marcus Hans, Jochen M. Schneider, Raheleh Hadian
0citations -
Towards Establishing Best Practice in the Analysis of Hydrogen and Deuterium by Atom Probe Tomography2024 Microscopy and Microanalysis article Engineering Advanced Materials Characterization Techniques Open access
Baptiste Gault, Aparna Saksena, Xavier Sauvage, Paul A.J. Bagot, Leonardo Shoji Aota, Jonas Arlt, +35 more
44citations -
A Quantitative Investigation of Functionalized Glazing Stacks by Atom Probe Tomography2022 Advanced Materials Technologies article Engineering Advanced Materials Characterization Techniques Open access
Jacques Perrin Toinin, Constantinos Hatzoglou, Justine Voronkoff, Hervé Montigaud, Denis Guimard, Matthias Wuttig, +2 more
4citations -
A Machine Learning Framework for Quantifying Chemical Segregation and Microstructural Features in Atom Probe Tomography Data2023 Microscopy and Microanalysis article Engineering Advanced Materials Characterization Techniques Open access
Alaukik Saxena, Nikita Polin, Navyanth Kusampudi, Shyam Katnagallu, Leopoldo Molina‐Luna, Oliver Gutfleisch, +4 more
20citations -
Quantifying Lithium in Lithium-ion battery solid electrolyte by atom probe tomography correlated with high-resolution scanning electron microscopy2022 Microscopy and Microanalysis article Engineering Advanced Materials Characterization Techniques
Oana Cojocaru‐Mirédin, Johannes Schmieg, Marius Müller, André Weber, Ellen Ivers‐Tiffée, Dagmar Gerthsen
2citations -
Grain Boundaries in Cu(In, Ga)Se 2 : A Review of Composition–Electronic Property Relationships by Atom Probe Tomography and Correlative Microscopy2021 Advanced Functional Materials article Engineering Chalcogenide Semiconductor Thin Films Open access
Oana Cojocaru‐Mirédin, Mohit Raghuwanshi, Roland Wüerz, Sascha Sadewasser
54citations -
An exploration of contrastive self-supervised learning for reconstructed atom probe tomography data2026 Machine Learning Science and Technology article Engineering Advanced Materials Characterization Techniques Open access
Janis A. Sälker, Marcus Hans, Jochen M. Schneider, Raheleh Hadian
0citations -
Atomic‐Scale Study on Core–Shell Cu Precipitation in Steels: Atom Probe Tomography and Ab Initio Calculations2024 steel research international article Engineering Advanced Materials Characterization Techniques Open access
Xiao Huan Shen, Yixu Wang, Zigan Xu, Bowen Zou, Enzo Liotti, Richard Dronskowski, +1 more
3citations