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Probing the onset of wurtzite phase formation in (V,Al)N thin films by transmission electron microscopy and atom probe tomography2022 Surface and Coatings Technology article Physics and Astronomy GaN-based semiconductor devices and materials Open access
Marcus Hans, Zsolt Czigány, Deborah Neuß, Janis A. Sälker, Holger Rueß, Janina Krause, +3 more
20citations -
$\textit{Ab initio}$-guided X-ray photoelectron spectroscopy quantification of Ti vacancies in Ti$_{1-δ}$O$_x$N$_{1-x}$ thin films2021 arXiv (Cornell University) preprint Materials Science Electron and X-Ray Spectroscopy Techniques Open access
Pavel Ondračka, Marcus Hans, Damian M. Holzapfel, Daniel Primetzhofer, David Holec, Jochen M. Schneider
0citations -
Synthese und resistive Schaltmechanismen von Mott-Isolatoren basierend auf undotieren und Cr-dotierten Vanadiumoxid Dünnschichten als Funktion der Nanostruktur und der Materialeigenschaften0citations