Not finding it? Sign in to also search OpenAlex live.
-
Ab initio-guided X-ray photoelectron spectroscopy quantification of Ti vacancies in Ti 1 − δ O x N 1 − x thin films2022 Acta Materialia article Materials Science Electron and X-Ray Spectroscopy Techniques Open access
Pavel Ondračka, Marcus Hans, Damian M. Holzapfel, Daniel Primetzhofer, David Holec, Jochen M. Schneider
5citations -
Orientation dependence of the fracture mechanisms in (V,Al)N coatings determined by micropillar compression2022 Journal of materials research/Pratt's guide to venture capital sources article Engineering Metal and Thin Film Mechanics Open access cited by 1 patent
Markus R. Schoof, J.S. Gibson, Soheil Karimi Aghda, Marcus Hans, Jochen M. Schneider, Sandra Korte‐Kerzel
4citations -
Resolving the microstructure of aluminum-doped zinc oxide thin films grown on different silicon heterojunction solar cell structures by advanced transmission electron microscopy
Sara Alkhereibi, Muhammad Ainul Yaqin, Alexander Eberst, Binbin Xu, Janghyun Jo, Husain Rashad Alsamamra, +4 more
6citations -
CrN/AlN nanolaminates: Architecture, residual stresses, and cracking behavior2021 Journal of Vacuum Science & Technology A Vacuum Surfaces and Films article Engineering Metal and Thin Film Mechanics
Kirsten Bobzin, T. Brögelmann, N.C. Kruppe, Hans Jürgen Maier, T. Heidenblut, Hans‐Bernward Besserer, +2 more
3citations -
Probing the onset of wurtzite phase formation in (V,Al)N thin films by transmission electron microscopy and atom probe tomography2022 Surface and Coatings Technology article Physics and Astronomy GaN-based semiconductor devices and materials Open access
Marcus Hans, Zsolt Czigány, Deborah Neuß, Janis A. Sälker, Holger Rueß, Janina Krause, +3 more
20citations