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Papers 6

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Sub-pixel electron detection using a convolutional neural network
2020 Ultramicroscopy article Physics and Astronomy Particle Detector Development and Performance Open access cited by 3 patents

J. Paul van Schayck, Eric van Genderen, E. Maddox, Lucas Roussel, Hugo Boulanger, E. Fröjdh, +3 more

30

citations
Complementary LEEM and eV-TEM for imaging and spectroscopy
2021 Ultramicroscopy article Biochemistry, Genetics and Molecular Biology Advanced Electron Microscopy Techniques and Applications Open access

Peter S. Neu, Daniël Geelen, Aniket Thete, Rudolf M. Tromp, Sense Jan van der Molen

11

citations
Low energy electron microscopy at cryogenic temperatures
2023 Ultramicroscopy article Materials Science Electron and X-Ray Spectroscopy Techniques Open access

Arash Tebyani, Sebastian Schramm, Marcel B. S. Hesselberth, Daan B Boltje, Johannes Jobst, Rudolf M. Tromp, +1 more

6

citations
Back illuminated photo emission electron microscopy (BIPEEM)
2023 Ultramicroscopy article Materials Science Electron and X-Ray Spectroscopy Techniques Open access

Amin Moradi, Matthijs Rog, Rudolf M. Tromp, Sense Jan van der Molen

4

citations
Bi-directional LEEM and eV-TEM spectroscopy on a graphene-hBN heterostack
2025 Ultramicroscopy article Materials Science Electron and X-Ray Spectroscopy Techniques Open access

Peter S. Neu, Eugene E. Krasovskii, Rudolf M. Tromp, Sense Jan van der Molen

3

citations
Extracting transverse electron mean free paths in graphene at low energy
2023 Ultramicroscopy article Materials Science Electron and X-Ray Spectroscopy Techniques Open access

Peter S. Neu, Daniël Geelen, Rudolf M. Tromp, Sense Jan van der Molen

1

citations

6 results