Back illuminated photo emission electron microscopy (BIPEEM)
Ultramicroscopy, vol. 253, pp. 113809
Abstract
A new, complementary technique based on Photo Emission Electron Microscopy (PEEM) is demonstrated. In contrast to PEEM, the sample is placed on a transparent substrate and is illuminated from the back side while electrons are collected from the other (front) side. In this paper, the working principle of this technique, coined back-illuminated PEEM (BIPEEM), is described. In BIPEEM, the electron intensity is strongly thickness-dependent. This dependence can be described by a simple model which contains the optical attenuation length and the electron mean free path. Electrons forming an image in BIPEEM hence carry information of the inner part of the sample, as well as of the surface, as we demonstrate experimentally.
Authors 4
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Affiliation as printed
Leiden Institute of Physics, Niels Bohrweg2, Leiden, the Netherlands
Leiden Institute of Physics, Niels Bohrweg2, Leiden, The Netherlands
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Affiliation as printed
Leiden Institute of Physics, Niels Bohrweg2, Leiden, the Netherlands
Leiden Institute of Physics, Niels Bohrweg2, Leiden, The Netherlands
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Leiden University · IBM (United States) · IBM Research - Thomas J. Watson Research Center
Affiliation as printed
Leiden Institute of Physics, Niels Bohrweg2, Leiden, the Netherlands; IBM T.J.Watson Research Center, Yorktown Heights, New York 10598, United States
IBM T.J.Watson Research Center, Yorktown Heights, New York 10598, USA
Leiden Institute of Physics, Niels Bohrweg2, Leiden, The Netherlands
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Affiliation as printed
Leiden Institute of Physics, Niels Bohrweg2, Leiden, the Netherlands
Leiden Institute of Physics, Niels Bohrweg2, Leiden, The Netherlands
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