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Papers matching “RISC-V” 1

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Scaling Logic Area With Multitier Standard Cells
2024 IEEE Journal on Exploratory Solid-State Computational Devices and Circuits article Engineering 3D IC and TSV technologies Open access

Florian Freye, Christian Lanius, Hossein Hashemi Shadmehri, Diana Göhringer, Tobias Gemmeke

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