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Papers matching “silicon defects” 1

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Characterization and Test of Intermittent Over RESET in RRAMs
2023 Proceedings - Asian Test Symposium/Proceedings conference-paper Computer Science VLSI and Analog Circuit Testing Open access

Hanzhi Xun, Moritz Fieback, Sicong Yuan, Hassen Aziza, M. Heidekamp, T. Copetti, +3 more

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citations

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