Not finding it? Sign in to also search OpenAlex live.
-
Hard-to-Detect Fault Analysis in FinFET SRAMs2021 IEEE Transactions on Very Large Scale Integration (VLSI) Systems article Computer Science VLSI and Analog Circuit Testing Open access
Guilherme Cardoso Medeiros, Moritz Fieback, Lizhou Wu, Mottaqiallah Taouil, L. M. Bolzani Poehls, Said Hamdioui
15citations -
Slicing Match-Action Pipeline Resources for Multitenancy on Programmable Switches2025 IEEE International Conference on Network Softwarization (NetSoft) conference-paper Computer Science Software-Defined Networks and 5G
Johannes Krude, Felix Frei, Pedram Ahmadiyeh, René Glebke, Mirko Stoffers, Klaus Wehrle
1citations -
Improving the Detection of Undefined State Faults in FinFET SRAMs2021 International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) conference-paper Computer Science VLSI and Analog Circuit Testing Open access
Guilherme Cardoso Medeiros, Moritz Fieback, T. Copetti, Anteneh Gebregiorgis, Mottaqiallah Taouil, Letícia Bolzani Poehls, +1 more
1citations -
Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMs2021 Proceedings/Proceedings - European Test Workshop conference-paper Computer Science VLSI and Analog Circuit Testing Open access
Guilherme Cardoso Medeiros, Moritz Fieback, Anteneh Gebregiorgis, Mottaqiallah Taouil, Letícia Bolzani Poehls, Said Hamdioui
6citations -
An Energy-Efficient and Area-Efficient Depthwise Separable Convolution Accelerator with Minimal On-Chip Memory Access2023 IFIP/IEEE International Conference on Very Large Scale Integration conference-paper Computer Science Advanced Neural Network Applications
Yi Chen, Jie Lou, Christian Lanius, Florian Freye, Johnson Loh, Tobias Gemmeke
7citations
6 results