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Papers matching “CMOS compatibility” 7

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Analyzing the Use of Temperature to Facilitate Fault Propagation in ReRAMs
2024 IEEE Latin American Test Symposium (LATS) conference-paper Computer Science VLSI and Analog Circuit Testing

T. Copetti, A. Chordia, Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui, L. M. Bolzani Poehls

2

citations
A DfT Strategy for Guaranteeing ReRAM’s Quality after Manufacturing
2024 Journal of Electronic Testing article Computer Science VLSI and Analog Circuit Testing Open access

T. Copetti, Moritz Fieback, Tobias Gemmeke, Said Hamdioui, L. M. Bolzani Poehls

10

citations
Gate Camouflaging Using Reconfigurable ISFET-Based Threshold Voltage Defined Logic
2023 IEEE Interregional NEWCAS Conference (NEWCAS) conference-paper Computer Science Physical Unclonable Functions (PUFs) and Hardware Security

Elmira Moussavi, Animesh Kumar Singh, Dominik Šišejković, Aravind Padma Kumar, Daniyar Kizatov, Sven Ingebrandt, +3 more

3

citations
Gate Camouflaging Using Reconfigurable ISFET-Based Threshold Voltage Defined Logic
2023 RWTH Publications (RWTH Aachen) conference-paper Computer Science Physical Unclonable Functions (PUFs) and Hardware Security Open access

Elmira Moussavi, Animesh Kumar Singh, Dominik Šišejković, Aravind Padma Kumar, Daniyar Kizatov, Sven Ingebrandt, +3 more

0

citations
Validating a DFT Strategy’s Detection Capability regarding Emerging Faults in RRAMs
2021 IFIP/IEEE International Conference on Very Large Scale Integration conference-paper Computer Science VLSI and Analog Circuit Testing cited by 5 patents

T. Copetti, Tobias Gemmeke, L. M. Bolzani Poehls

14

citations
Exploring the use of extreme temperatures to facilitate fault propagation in ReRAMs
2025 Microelectronics Reliability article Computer Science VLSI and Analog Circuit Testing Open access

T. Copetti, A. Chordia, Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui, L. M. Bolzani Poehls

1

citations
Exploring an On-Chip Sensor to Detect Unique Faults in RRAMs
2022 IEEE Latin American Test Symposium (LATS) conference-paper Computer Science VLSI and Analog Circuit Testing Open access

T. Copetti, M. Nilovic, Moritz Fieback, Tobias Gemmeke, Said Hamdioui, L. M. Bolzani Poehls

7

citations

7 results