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Papers matching “resistive random access memory” 6

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Characterization and Test of Intermittent Over RESET in RRAMs
2023 Proceedings - Asian Test Symposium/Proceedings conference-paper Computer Science VLSI and Analog Circuit Testing Open access

Hanzhi Xun, Moritz Fieback, Sicong Yuan, Hassen Aziza, M. Heidekamp, T. Copetti, +3 more

2

citations
Exploring the use of extreme temperatures to facilitate fault propagation in ReRAMs
2025 Microelectronics Reliability article Computer Science VLSI and Analog Circuit Testing Open access

T. Copetti, A. Chordia, Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui, L. M. Bolzani Poehls

1

citations
A DfT Strategy for Guaranteeing ReRAM’s Quality after Manufacturing
2024 Journal of Electronic Testing article Computer Science VLSI and Analog Circuit Testing Open access

T. Copetti, Moritz Fieback, Tobias Gemmeke, Said Hamdioui, L. M. Bolzani Poehls

10

citations
Exploring an On-Chip Sensor to Detect Unique Faults in RRAMs
2022 IEEE Latin American Test Symposium (LATS) conference-paper Computer Science VLSI and Analog Circuit Testing Open access

T. Copetti, M. Nilovic, Moritz Fieback, Tobias Gemmeke, Said Hamdioui, L. M. Bolzani Poehls

7

citations
A DfT Strategy for Detecting Emerging Faults in RRAMs
2022 IFIP advances in information and communication technology conference-paper Computer Science VLSI and Analog Circuit Testing Open access

T. Copetti, Tobias Gemmeke, L. M. Bolzani Poehls

3

citations
Hard-to-Detect Fault Analysis in FinFET SRAMs
2021 IEEE Transactions on Very Large Scale Integration (VLSI) Systems article Computer Science VLSI and Analog Circuit Testing Open access

Guilherme Cardoso Medeiros, Moritz Fieback, Lizhou Wu, Mottaqiallah Taouil, L. M. Bolzani Poehls, Said Hamdioui

15

citations

6 results