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Hard-to-Detect Fault Analysis in FinFET SRAMs2021 IEEE Transactions on Very Large Scale Integration (VLSI) Systems article Computer Science VLSI and Analog Circuit Testing Open access
Guilherme Cardoso Medeiros, Moritz Fieback, Lizhou Wu, Mottaqiallah Taouil, L. M. Bolzani Poehls, Said Hamdioui
15citations -
Improving the Detection of Undefined State Faults in FinFET SRAMs2021 International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) conference-paper Computer Science VLSI and Analog Circuit Testing Open access
Guilherme Cardoso Medeiros, Moritz Fieback, T. Copetti, Anteneh Gebregiorgis, Mottaqiallah Taouil, Letícia Bolzani Poehls, +1 more
1citations -
Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMs2021 Proceedings/Proceedings - European Test Workshop conference-paper Computer Science VLSI and Analog Circuit Testing Open access
Guilherme Cardoso Medeiros, Moritz Fieback, Anteneh Gebregiorgis, Mottaqiallah Taouil, Letícia Bolzani Poehls, Said Hamdioui
6citations
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