August 26, 2026 article Bulk stacking fault probability as a diffraction-derived metric for quantitative planar defect kinetics Journal of Material Science and Technology DOI: 10.1016/j.jmst.2026.08.037 OpenAlex Authors 0 Author list not loaded yet. Cited by 0 stored of 0 References 1 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Modeling and simulation of microstructure in metallic systems based on multi-physics approaches 2022 npj Computational Materials article Materials Science Microstructure and mechanical properties Open access 37 citations 1 result