June 01, 2026 conference-paper Evaluation of Early Fault Detection Algorithms for DC Circuits Using Trend Analysis in Embedded Systems Progress in Applied Electrical Engineering (PAEE) DOI: 10.1109/paee71887.2026.11660685 OpenAlex Authors 0 Author list not loaded yet. Cited by 0 stored of 0 References 1 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access A Comprehensive Fault Detection and Isolation Method for DC Microgrids Using Reduced-Order Unknown Input Observers 2023 IEEE Transactions on Power Delivery article Engineering HVDC Systems and Fault Protection 24 citations 1 result