August 12, 2026 article Understanding and Addressing Reliability Challenges in MoS₂-Based Circuits Under Static and Transient Stress Conditions IEEE Transactions on Electron Devices DOI: 10.1109/ted.2026.3721034 OpenAlex Authors 0 Author list not loaded yet. Cited by 0 stored of 0 References 1 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Insulators for 2D nanoelectronics: the gap to bridge 2020 Nature Communications article Materials Science 2D Materials and Applications Open access cited by 3 patents 561 citations 1 result