January 01, 2026 article Open access Effect of Back-Gate Bias-Induced Interfaces on the Zero-Temperature-Coefficient in Fully Depleted SOI Transistors IEEE Journal of the Electron Devices Society DOI: 10.1109/jeds.2026.3717628 Full text (OA) OpenAlex Authors 0 Author list not loaded yet. Cited by 0 stored of 0 References 1 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Ultra-low-power cryogenic complementary metal oxide semiconductor technology 2025 Nature Reviews Electrical Engineering review Engineering Advancements in Semiconductor Devices and Circuit Design 18 citations 1 result