RAPID-JS: A Cross-platform Application for Instant Indexing SAED Patterns of Cubic Materials via a Web Browser

Microscopy Today, vol. 34, pp. 15–20

Abstract

Abstract RAPID-JS, a browser-based implementation of the Rn-ratio method for indexing selected area electron diffraction patterns of cubic and pseudocubic materials, is introduced. Implemented in Svelte/ECMAScript (JavaScript) and accelerated by precomputed lookup tables covering 136 common orientations of P, I, F, and diamond lattices, RAPID-JS allows the interactive indexing of calibrated and uncalibrated selected area electron diffraction spot patterns via a graphical user interface. The functionality of the program is demonstrated using a selected area electron diffraction pattern from a polysynthetic twinned cubic diamond. The program supports standard image formats for pattern import, and it returns lattice orientations and diffraction spot indices within user-defined tolerances for ratios and angles. RAPID-JS is a lightweight, cross-platform tool designed to facilitate the quick on-site analysis of selected area electron diffraction patterns in electron microscopy and crystallography research and teaching courses.

Authors 2

1. Jakob Weirich
   Affiliation as printed

   D-57072 Siegen ,

2. Thomas E. Weirich corresponding Aachen Gemeinschaftslabor für Elektronenmikroskopie (GFE)

   RWTH Aachen University

   Affiliation as printed

   Gemeinschaftslabor für Elektronenmikroskopie (GFE), RWTH Aachen University , D-52074 Aachen ,