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January 19, 2026 conference-paper

PV-ReCAM: Process Variation-Aware Testing for ReRAM-based Content Addressable Memory

Asia and South Pacific Design Automation Conference (ASP-DAC)

DOI: 10.1109/asp-dac66049.2026.11420683 OpenAlex

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References 4

Variability-Aware Modeling of Filamentary Oxide-Based Bipolar Resistive Switching Cells Using SPICE Level Compact Models
2020 IEEE Transactions on Circuits and Systems I Regular Papers article Engineering Advanced Memory and Neural Computing Open access

139

citations
HRS Instability in Oxide-Based Bipolar Resistive Switching Cells
2020 IEEE Transactions on Electron Devices article Engineering Advanced Memory and Neural Computing

57

citations
Validating a DFT Strategy’s Detection Capability regarding Emerging Faults in RRAMs
2021 IFIP/IEEE International Conference on Very Large Scale Integration conference-paper Computer Science VLSI and Analog Circuit Testing cited by 5 patents

14

citations
A DfT Strategy for Guaranteeing ReRAM’s Quality after Manufacturing
2024 Journal of Electronic Testing article Computer Science VLSI and Analog Circuit Testing Open access

10

citations

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