December 23, 2025 article Optimization and Mitigation of Access-Transistor-Induced Reliability Degradation in 28 nm 1T1R RRAM Arrays IEEE Transactions on Electron Devices DOI: 10.1109/ted.2025.3644276 OpenAlex Authors 0 Author list not loaded yet. Cited by 0 stored of 2 References 1 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Understanding Transistor Aging Impact on the Behavior of RRAM Cells 2024 IFIP/IEEE International Conference on Very Large Scale Integration conference-paper Engineering Advanced Memory and Neural Computing 4 citations 1 result