W6692832300

• An Active Gate Driver for Iteratively Optimizing the Switching Characteristics of SiC MOSFETs

  2023 European Conference on Power Electronics and Applications conference-paper Engineering Silicon Carbide Semiconductor Technologies

  5

  citations
• High dv/dt Testing of Coil Winding Insulation Systems for Wide-Bandgap Applications

  2023 International Conference on Power Electronics and ECCE Asia (ICPE-ECCE Asia) conference-paper Materials Science High voltage insulation and dielectric phenomena

  2

  citations
• Evaluating On-State Voltage and Junction Temperature Monitoring Concepts for Wide-Bandgap Semiconductor Devices

  2022 IEEE Transactions on Industry Applications article Engineering Silicon Carbide Semiconductor Technologies Open access

  11

  citations
• SiC-Based dv/dt Generator for Insulation Testing with Fast and Adjustable Switching Transients

  2021 IEEE Workshop on Wide Bandgap Power Devices and Applications conference-paper Engineering Silicon Carbide Semiconductor Technologies

  5

  citations
• Online Junction Temperature Monitoring of Power Semiconductor Devices Based on a Wheatstone Bridge

  2021 IEEE Energy Conversion Congress and Exposition (ECCE) conference-paper Engineering Silicon Carbide Semiconductor Technologies Open access

  9

  citations
• Intelligent Gate Drivers for Future Power Converters

  2021 IEEE Transactions on Power Electronics article Engineering Silicon Carbide Semiconductor Technologies cited by 2 patents

  104

  citations

6 results