April 01, 2003 article Dynamic Faults in Random-Access-Memories: Concept, Fault Models and Tests Journal of Electronic Testing DOI: 10.1023/a:1022802010738 OpenAlex Authors 0 Author list not loaded yet. Cited by 1 stored of 52 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Fault Injection in Logic-in-Memory Architectures 2026 Synthesis lectures on engineering, science, and technology book-chapter Engineering Advanced Memory and Neural Computing 0 citations 1 result References 0