A

Defect-engineered competition between exciton annihilation and trapping in MOCVD WS 2

Chemical Science, vol. 17, pp. 1176–1185

Abstract

Steady-state and ultrafast spectroscopy reveal how controlled defect introduction tunes defect trapping and exciton–exciton annihilation in MOCVD-grown WS 2 , establishing a quantitative framework for diffusion-limited exciton dynamics.

Authors 12

  1. University of Waterloo

    Affiliation as printed

    Department of Chemistry, University of Waterloo, Waterloo, Ontario N2L 3G1, Canada

    Department of Chemistry, University of Waterloo Waterloo Ontario N2L 3G1 Canada gsciaini@uwaterloo.ca

  2. University of Duisburg-Essen

    Affiliation as printed

    Fakultät für Physik and CENIDE, University of Duisburg-Essen, Duisburg 47057, Germany

    Fakultät für Physik and CENIDE, University of Duisburg-Essen Duisburg 47057 Germany marika.schleberger@uni-due.de

  3. University of Duisburg-Essen

    Affiliation as printed

    Fakultät für Physik and CENIDE, University of Duisburg-Essen, Duisburg 47057, Germany

    Fakultät für Physik and CENIDE, University of Duisburg-Essen Duisburg 47057 Germany marika.schleberger@uni-due.de

  4. University of Waterloo

    Affiliation as printed

    Department of Chemistry, University of Waterloo, Waterloo, Ontario N2L 3G1, Canada

    Department of Chemistry, University of Waterloo Waterloo Ontario N2L 3G1 Canada gsciaini@uwaterloo.ca

  5. RWTH Aachen University

    Affiliation as printed

    Compound Semiconductor Technology, RWTH Aachen University, Aachen 52074, Germany

    Compound Semiconductor Technology, RWTH Aachen University Aachen 52074 Germany

  6. University of Duisburg-Essen

    Affiliation as printed

    Werkstoffe der Elektrotechnik and CENIDE, University of Duisburg-Essen, Duisburg 47057, Germany

    Werkstoffe der Elektrotechnik and CENIDE, University of Duisburg-Essen Duisburg 47057 Germany

  7. University of Duisburg-Essen

    Affiliation as printed

    Werkstoffe der Elektrotechnik and CENIDE, University of Duisburg-Essen, Duisburg 47057, Germany

    Werkstoffe der Elektrotechnik and CENIDE, University of Duisburg-Essen Duisburg 47057 Germany

  8. Aixtron (Germany)

    Affiliation as printed

    AIXTRON SE, Herzogenrath 52134, Germany

    AIXTRON SE Herzogenrath 52134 Germany

  9. RWTH Aachen University

    Affiliation as printed

    Compound Semiconductor Technology, RWTH Aachen University, Aachen 52074, Germany

    Compound Semiconductor Technology, RWTH Aachen University Aachen 52074 Germany

  10. RWTH Aachen University

    Affiliation as printed

    Compound Semiconductor Technology, RWTH Aachen University, Aachen 52074, Germany

    Compound Semiconductor Technology, RWTH Aachen University Aachen 52074 Germany

  11. University of Duisburg-Essen

    Affiliation as printed

    Fakultät für Physik and CENIDE, University of Duisburg-Essen, Duisburg 47057, Germany

    Fakultät für Physik and CENIDE, University of Duisburg-Essen Duisburg 47057 Germany marika.schleberger@uni-due.de

  12. University of Waterloo

    Affiliation as printed

    Department of Chemistry, University of Waterloo, Waterloo, Ontario N2L 3G1, Canada

    Department of Chemistry, University of Waterloo Waterloo Ontario N2L 3G1 Canada gsciaini@uwaterloo.ca

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References 63