September 01, 2025 article A Comparative Evaluation of Different Test Structures for the Extraction of Ultralow Specific Contact Resistivity: A Review IEEE Transactions on Electron Devices DOI: 10.1109/ted.2025.3602375 OpenAlex Authors 0 Author list not loaded yet. Cited by 0 stored of 3 References 2 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Dependable Contact Related Parameter Extraction in Graphene–Metal Junctions 2020 Advanced Electronic Materials article Materials Science Graphene research and applications Open access 31 citations Dependability Assessment of Transfer Length Method to Extract the Metal–Graphene Contact Resistance 2020 IEEE Transactions on Semiconductor Manufacturing article Physics and Astronomy Semiconductor materials and interfaces Open access 16 citations 2 results