Multiparameter admittance spectroscopy for investigating defects in MoS${_2}$ thin film MOSFETs
Abstract
A method for assessing the quality of electronic material properties of thin-film metal oxide semiconductor field-effect transistors (MOSFETs) is presented. By investigating samples with MOCVD-grown MoS${_2}$ channels exposed to atmospheric conditions, the existence of electron traps in MoS${_2}$ and at the interface between the gate insulator and the thin-film MoS${_2}$ are revealed. Differential conductance and capacitance data of the transistor channels are plotted as 3D surfaces on a base plane spanned by the measurement frequency versus the gate voltage. The existence of defects is confirmed by comparison with ideal results from a theoretical model.
Authors 7
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RWTH Aachen University · AMO (Germany)
Affiliation as printed
AMO GmbH , Otto-Blumenthal-Strasse 25 , 52074 Aachen , Germany
Chair of Electronic Devices , RWTH Aachen University , Otto-Blumenthal-Strasse 25 , 52074 Aachen , Germany
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Affiliation as printed
Chair of Electronic Devices , RWTH Aachen University , Otto-Blumenthal-Strasse 25 , 52074 Aachen , Germany
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RWTH Aachen University · AMO (Germany)
Affiliation as printed
AMO GmbH , Otto-Blumenthal-Strasse 25 , 52074 Aachen , Germany
Chair of Electronic Devices , RWTH Aachen University , Otto-Blumenthal-Strasse 25 , 52074 Aachen , Germany
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Affiliation as printed
AMO GmbH , Otto-Blumenthal-Strasse 25 , 52074 Aachen , Germany
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RWTH Aachen University · Aixtron (Germany)
Affiliation as printed
AIXTRON SE , Dornkaulstrasse 2 , 52134 Herzogenrath , Germany
Compound Semiconductor Technology , RWTH Aachen University , Sommerfeldstrasse 18 , 52074 Aachen , Germany
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RWTH Aachen University · AMO (Germany)
Affiliation as printed
AMO GmbH , Otto-Blumenthal-Strasse 25 , 52074 Aachen , Germany
Chair of Electronic Devices , RWTH Aachen University , Otto-Blumenthal-Strasse 25 , 52074 Aachen , Germany
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Affiliation as printed
AMO GmbH , Otto-Blumenthal-Strasse 25 , 52074 Aachen , Germany
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