February 19, 2024 article Element specific atom counting for heterogeneous nanostructures: Combining multiple ADF STEM images for simultaneous thickness and composition determination Ultramicroscopy DOI: 10.1016/j.ultramic.2024.113941 OpenAlex Authors 0 Author list not loaded yet. Cited by 0 stored of 3 References 3 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Influence of plasmon excitations on atomic-resolution quantitative 4D scanning transmission electron microscopy 2020 Scientific Reports article Biochemistry, Genetics and Molecular Biology Advanced Electron Microscopy Techniques and Applications Open access 27 citations Contribution of multiple plasmon scattering in low-angle electron diffraction investigated by energy-filtered atomically resolved 4D-STEM 2022 Applied Physics Letters article Biochemistry, Genetics and Molecular Biology Advanced Electron Microscopy Techniques and Applications Open access 13 citations Angle-resolved STEM using an iris aperture: Scattering contributions and sources of error for the quantitative analysis in Si 2020 Ultramicroscopy article Biochemistry, Genetics and Molecular Biology Advanced Electron Microscopy Techniques and Applications 9 citations 3 results