Memristive devices for metrological applications

ACTA IMEKO, vol. 12, pp. 1–5

Abstract

The EMPIR project 20FUN06 MEMQuD - “Memristive devices as quantum standard for nanometrology” has as one of its fundamental goals the development of technical capability and scientific knowledge for the implementation of a quantum resistance standard based on memristive devices characterized by high scalability down to the nanometer scale, CMOS compatibility and working in air at room temperature. In this work it is presented an overview of the project, highlighted relevant characteristics and working principles of memristive devices and potential applications with focus on metrological application with framing allowed by the last revision of the International System of Units (SI) that is the motivation and background for the aim of this project

Authors 12

1. Vítor Cabral

   Instituto Português Da Qualidade

   Affiliation as printed

   Instituto Português da Qualidade

2. Alessandro Cultrera

   Istituto Nazionale di Ricerca Metrologica

   Affiliation as printed

   Istituto Nazionale di Ricerca Metrologica- Quantum Metrology and Nanotechnologies

3. Shaochuan Chen Aachen

   RWTH Aachen University

   Affiliation as printed

   RWTH-Aachen university

4. João Pereira

   Instituto de Engenharia de Sistemas e Computadores Microsistemas e Nanotecnologias

   Affiliation as printed

   INESC Microsistemas e Nanotecnologias

5. Luís Ribeiro

   Instituto Português Da Qualidade

   Affiliation as printed

   Instituto Português da Qualidade

6. Isabel Godinho

   Instituto Português Da Qualidade

   Affiliation as printed

   Instituto Português da Qualidade

7. Luca Boarino

   Istituto Nazionale di Ricerca Metrologica

   Affiliation as printed

   Istituto Nazionale di Ricerca Metrologica- Advanced Materials and Life Sciences Division

8. Nastacia De Leo

   Istituto Nazionale di Ricerca Metrologica

   Affiliation as printed

   Istituto Nazionale di Ricerca Metrologica- Advanced Materials and Life Sciences Division

9. Luca Callegaro

   Istituto Nazionale di Ricerca Metrologica

   Affiliation as printed

   Istituto Nazionale di Ricerca Metrologica- Quantum Metrology and Nanotechnologies

10. Susana Cardoso

    Instituto de Engenharia de Sistemas e Computadores Microsistemas e Nanotecnologias

    Affiliation as printed

    INESC Microsistemas e Nanotecnologias

11. Ilia Valov Aachen

    RWTH Aachen University

    Affiliation as printed

    RWTH-Aachen university

12. Gianluca Milano

    Istituto Nazionale di Ricerca Metrologica

    Affiliation as printed

    Istituto Nazionale di Ricerca Metrologica- Advanced Materials and Life Sciences Division