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Two-dimensional tellurium-based diodes for RF applications

npj 2D Materials and Applications, vol. 7

Abstract

Abstract The research of two-dimensional (2D) Tellurium (Te) or tellurene is thriving to address current challenges in emerging thin-film electronic and optoelectronic devices. However, the study of 2D-Te-based devices for high-frequency applications is still lacking in the literature. This work presents a comprehensive study of two types of radio frequency (RF) diodes based on 2D-Te flakes and exploits their distinct properties in two RF applications. First, a metal-insulator-semiconductor (MIS) structure is employed as a nonlinear device in a passive RF mixer, where the achieved conversion loss at 2.5 GHz and 5 GHz is as low as 24 dB and 29 dB, respectively. Then, a metal-semiconductor (MS) diode is tested as a zero-bias millimeter-wave power detector and reaches an outstanding linear-in-dB dynamic range over 40 dB, while having voltage responsivities as high as 257 V ⋅ W−1at 1 GHz (up to 1 V detected output voltage) and 47 V ⋅ W−1at 2.5 GHz (up to 0.26 V detected output voltage). These results show superior performance compared to other 2D material-based devices in a much more mature technological phase. Thus, the authors believe that this work demonstrates the potential of 2D-Te as a promising material for devices in emerging high-frequency electronics.

Authors 7

  1. Abdelrahman M. Askar corresponding

    Simon Fraser University

    Affiliation as printed

    School of Engineering Science, Simon Fraser University, 8888 University Drive, Burnaby, British Columbia, V5A 1S6, Canada

  2. RWTH Aachen University

    Affiliation as printed

    Chair of High Frequency Electronics (HFE), RWTH Aachen University, Koppernikusstr. 16, 52074, Aachen, Germany

  3. Francisco Pasadas corresponding

    Universidad de Granada

    Affiliation as printed

    Pervasive Electronics Advanced Research Laboratory (PEARL), Departamento de Electrónica y Tecnología de Computadores, Universidad de Granada, Campus de Fuentenueva, 18071, Granada, Spain

  4. RWTH Aachen University

    Affiliation as printed

    Chair of High Frequency Electronics (HFE), RWTH Aachen University, Koppernikusstr. 16, 52074, Aachen, Germany

  5. Simon Fraser University

    Affiliation as printed

    School of Engineering Science, Simon Fraser University, 8888 University Drive, Burnaby, British Columbia, V5A 1S6, Canada

  6. RWTH Aachen University

    Affiliation as printed

    Chair of High Frequency Electronics (HFE), RWTH Aachen University, Koppernikusstr. 16, 52074, Aachen, Germany

  7. Simon Fraser University

    Affiliation as printed

    School of Engineering Science, Simon Fraser University, 8888 University Drive, Burnaby, British Columbia, V5A 1S6, Canada

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References 61