September 14, 2023 article 4K Detectors Array for On-Wafer EUV Imaging in Lithography Control Beyond 5-nm Node IEEE Transactions on Electron Devices DOI: 10.1109/ted.2023.3311413 OpenAlex Authors 0 Author list not loaded yet. Cited by 0 stored of 5 References 1 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access EUV scattering from CNT pellicles: measurement and control 2021 conference-paper Engineering Advancements in Photolithography Techniques 4 citations 1 result