Reliability of Computing-In-Memory Concepts Based on Memristive Arrays
Technical digest - International Electron Devices Meeting/Technical digest, pp. 5.3.1–5.3.4
Abstract
Memristive Computing-in-Memory (CIM) allows for very dense and fast parallel data processing. However, the correctness in logic computing is limited due to operation variability and inherent memristive device variability. We review the current situation of reliability studies in memristive CIM and propose a novel framework for estimating operation failures in CIM-concepts using VCM-ReRAM devices.
Authors 8
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Affiliation as printed
Institute for Electronic Materials 2, RWTH,Aachen,Germany
Institute for Electronic Materials 2, RWTH, Aachen, Germany
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Affiliation as printed
Institute for Electronic Materials 2, RWTH,Aachen,Germany
Institute for Electronic Materials 2, RWTH, Aachen, Germany
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Karlsruhe Institute of Technology
Affiliation as printed
Chair for Dependable Nano Computing,KIT,Karlsruhe,Germany
KIT, Chair for Dependable Nano Computing, Karlsruhe, Germany
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Affiliation as printed
Institute for Electronic Materials 2, RWTH,Aachen,Germany
Institute for Electronic Materials 2, RWTH, Aachen, Germany
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Karlsruhe Institute of Technology
Affiliation as printed
Chair for Dependable Nano Computing,KIT,Karlsruhe,Germany
KIT, Chair for Dependable Nano Computing, Karlsruhe, Germany
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Affiliation as printed
Institute for Electronic Materials 2, RWTH,Aachen,Germany
Institute for Electronic Materials 2, RWTH, Aachen, Germany
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Affiliation as printed
Peter Grünberg Institut 7,Forschungszentrum Jülich GmbH,Jülich,Germany
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Karlsruhe Institute of Technology
Affiliation as printed
Chair for Dependable Nano Computing,KIT,Karlsruhe,Germany
KIT, Chair for Dependable Nano Computing, Karlsruhe, Germany
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References 8
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