May 01, 2022 conference-paper Reliability of 28nm embedded RRAM for consumer and industrial products IEEE International Memory Workshop (IMW) DOI: 10.1109/imw52921.2022.9779300 OpenAlex Authors 0 Author list not loaded yet. Cited by 4 stored of 24 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Understanding Transistor Aging Impact on the Behavior of RRAM Cells 2024 IFIP/IEEE International Conference on Very Large Scale Integration conference-paper Engineering Advanced Memory and Neural Computing 4 citations Lifecycle Management of Emerging Memories 2024 conference-paper Engineering Advanced Memory and Neural Computing 5 citations Memristive Devices for Time Domain Compute-in-Memory 2022 IEEE Journal on Exploratory Solid-State Computational Devices and Circuits article Engineering Advanced Memory and Neural Computing Open access cited by 1 patent 18 citations Endurance of 2 Mbit Based BEOL Integrated ReRAM 2022 IEEE Access article Engineering Advanced Memory and Neural Computing Open access 16 citations 4 results References 0