DfT schemes for resistive open defects in RRAMs

• Background

  2025 Synthesis lectures on engineering, science, and technology book-chapter Engineering Advanced Memory and Neural Computing

  0

  citations
• Analyzing the Use of Temperature to Facilitate Fault Propagation in ReRAMs

  2024 IEEE Latin American Test Symposium (LATS) conference-paper Computer Science VLSI and Analog Circuit Testing

  2

  citations
• A DfT Strategy for Guaranteeing ReRAM’s Quality after Manufacturing

  2024 Journal of Electronic Testing article Computer Science VLSI and Analog Circuit Testing Open access

  10

  citations
• Characterization and Test of Intermittent Over RESET in RRAMs

  2023 Proceedings - Asian Test Symposium/Proceedings conference-paper Computer Science VLSI and Analog Circuit Testing Open access

  2

  citations
• Embedded Tutorial - RRAMs: How to Guarantee Their Quality Test after Manufacturing?

  2023 conference-paper Computer Science VLSI and Analog Circuit Testing

  0

  citations
• Exploring an On-Chip Sensor to Detect Unique Faults in RRAMs

  2022 IEEE Latin American Test Symposium (LATS) conference-paper Computer Science VLSI and Analog Circuit Testing Open access

  7

  citations
• A DfT Strategy for Detecting Emerging Faults in RRAMs

  2022 IFIP advances in information and communication technology conference-paper Computer Science VLSI and Analog Circuit Testing Open access

  3

  citations
• Validating a DFT Strategy’s Detection Capability regarding Emerging Faults in RRAMs

  2021 IFIP/IEEE International Conference on Very Large Scale Integration conference-paper Computer Science VLSI and Analog Circuit Testing cited by 5 patents

  14

  citations
• Improving the Detection of Undefined State Faults in FinFET SRAMs

  2021 International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) conference-paper Computer Science VLSI and Analog Circuit Testing Open access

  1

  citations

9 results