Defects, Fault Modeling, and Test Development Framework for RRAMs

• Background

  2025 Synthesis lectures on engineering, science, and technology book-chapter Engineering Advanced Memory and Neural Computing

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  citations
• Exploring the use of extreme temperatures to facilitate fault propagation in ReRAMs

  2025 Microelectronics Reliability article Computer Science VLSI and Analog Circuit Testing Open access

  1

  citations
• A Combined Strategy for Testing RRAMs After Manufacturing and During Lifetime

  2025 IEEE Latin American Test Symposium (LATS) conference-paper Computer Science VLSI and Analog Circuit Testing

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• Analyzing the Use of Temperature to Facilitate Fault Propagation in ReRAMs

  2024 IEEE Latin American Test Symposium (LATS) conference-paper Computer Science VLSI and Analog Circuit Testing

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  citations
• A DfT Strategy for Guaranteeing ReRAM’s Quality after Manufacturing

  2024 Journal of Electronic Testing article Computer Science VLSI and Analog Circuit Testing Open access

  10

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• Embedded Tutorial - RRAMs: How to Guarantee Their Quality Test after Manufacturing?

  2023 conference-paper Computer Science VLSI and Analog Circuit Testing

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• Evaluating a New RRAM Manufacturing Test Strategy

  2023 IEEE Latin American Test Symposium (LATS) conference-paper Computer Science VLSI and Analog Circuit Testing

  9

  citations
• Exploring an On-Chip Sensor to Detect Unique Faults in RRAMs

  2022 IEEE Latin American Test Symposium (LATS) conference-paper Computer Science VLSI and Analog Circuit Testing Open access

  7

  citations

8 results