Graphene-based thin-films for flexible applications inspected by high-resolution Terahertz near-field inspection
International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), pp. 1–2
Abstract
Terahertz (THz) inspection is among the most versatile tools to perform non-destructive, quantitative characterization of conductive thin-films. In this work we apply high-resolution THz near-field measurements for the inspection of graphene-based thin-films for flexible applications. We show and discuss sheet resistance results for wafer-scale CVD-grown graphene as well as for conductive thin-films produced from dispersions of exfoliated graphene-flakes on various substrates.
Authors 10
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Protemics (Germany) · RWTH Aachen University
Affiliation as printed
Protemics GmbH, Aachen, Germany
RWTH Aachen University, Germany
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AMO (Germany) · RWTH Aachen University
Affiliation as printed
AMO GmbH, Aachen, Germany
RWTH Aachen University, Germany
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Affiliation as printed
Sixonia Tech GmbH, Dresden, Germany
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Protemics (Germany) · RWTH Aachen University
Affiliation as printed
Protemics GmbH, Aachen, Germany
RWTH Aachen University, Germany
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Affiliation as printed
Protemics GmbH, Aachen, Germany
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Affiliation as printed
AMO GmbH, Aachen, Germany
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Affiliation as printed
AMO GmbH, Aachen, Germany
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Affiliation as printed
AMO GmbH, Aachen, Germany
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Affiliation as printed
Protemics GmbH, Aachen, Germany
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AMO (Germany) · RWTH Aachen University
Affiliation as printed
AMO GmbH, Aachen, Germany
RWTH Aachen University, Germany
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References 4
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4 results