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Graphene-based thin-films for flexible applications inspected by high-resolution Terahertz near-field inspection

International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), pp. 1–2

Abstract

Terahertz (THz) inspection is among the most versatile tools to perform non-destructive, quantitative characterization of conductive thin-films. In this work we apply high-resolution THz near-field measurements for the inspection of graphene-based thin-films for flexible applications. We show and discuss sheet resistance results for wafer-scale CVD-grown graphene as well as for conductive thin-films produced from dispersions of exfoliated graphene-flakes on various substrates.

Authors 10

  1. Protemics (Germany) · RWTH Aachen University

    Affiliation as printed

    Protemics GmbH, Aachen, Germany

    RWTH Aachen University, Germany

  2. AMO (Germany) · RWTH Aachen University

    Affiliation as printed

    AMO GmbH, Aachen, Germany

    RWTH Aachen University, Germany

  3. Affiliation as printed

    Sixonia Tech GmbH, Dresden, Germany

  4. Protemics (Germany) · RWTH Aachen University

    Affiliation as printed

    Protemics GmbH, Aachen, Germany

    RWTH Aachen University, Germany

  5. Protemics (Germany)

    Affiliation as printed

    Protemics GmbH, Aachen, Germany

  6. AMO (Germany)

    Affiliation as printed

    AMO GmbH, Aachen, Germany

  7. AMO (Germany)

    Affiliation as printed

    AMO GmbH, Aachen, Germany

  8. AMO (Germany)

    Affiliation as printed

    AMO GmbH, Aachen, Germany

  9. Protemics (Germany)

    Affiliation as printed

    Protemics GmbH, Aachen, Germany

  10. AMO (Germany) · RWTH Aachen University

    Affiliation as printed

    AMO GmbH, Aachen, Germany

    RWTH Aachen University, Germany

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References 4

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