July 27, 2021 article Fault Modeling and Efficient Testing of Memristor-Based Memory IEEE Transactions on Circuits and Systems I Regular Papers DOI: 10.1109/tcsi.2021.3098639 OpenAlex Authors 0 Author list not loaded yet. Cited by 5 stored of 37 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Related Work 2026 Synthesis lectures on engineering, science, and technology book-chapter Engineering Advanced Memory and Neural Computing 0 citations A DfT Strategy for Guaranteeing ReRAM’s Quality after Manufacturing 2024 Journal of Electronic Testing article Computer Science VLSI and Analog Circuit Testing Open access 10 citations Embedded Tutorial - RRAMs: How to Guarantee Their Quality Test after Manufacturing? 2023 conference-paper Computer Science VLSI and Analog Circuit Testing 0 citations Invited Paper: A Holistic Fault Injection Platform for Neuromorphic Hardware 2023 IEEE Latin American Test Symposium (LATS) conference-paper Engineering Advanced Memory and Neural Computing 1 citations X-Fault: Impact of Faults on Binary Neural Networks in Memristor-Crossbar Arrays with Logic-in-Memory Computation 2022 IEEE International Conference on Artificial Intelligence Circuits and Systems (AICAS) conference-paper Engineering Advanced Memory and Neural Computing 10 citations 5 results References 0