A novel scattering-type SNOM-tip featuring a micro-integrated bias-free optically driven terahertz pulse emitter

International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), pp. 1–2

Abstract

In this work we present a new approach to enhance the measurement speed and signal-to-noise ratio of scattering-type scanning near-field optical microscopy (s-SNOM) systems aiming for time-domain operation at terahertz frequencies. It is based on a standard atomic-force-microscope (AFM) tip that is supplemented with an integrated THz source. This device is offering an efficient solution to reduce coupling losses between THz pulse emitter and the scattering tip - one of the main performance limiting factors in current state-of-the-art systems.

Authors 6

1. M. Nagel Aachen Protemics GmbH

   Protemics (Germany)

   Affiliation as printed

   Protemics GmbH, Aachen, NRW, Germany

2. Simon Sawallich Aachen Protemics GmbH

   Protemics (Germany)

   Affiliation as printed

   Protemics GmbH, Aachen, NRW, Germany

3. Alexander Michalski Aachen Protemics GmbH

   Protemics (Germany)

   Affiliation as printed

   Protemics GmbH, Aachen, NRW, Germany

4. Stephan Schäffer

   University of Siegen

   Affiliation as printed

   HQE, University of Siegen, NRW, Germany

5. Anna Katharina Wigger

   University of Siegen

   Affiliation as printed

   HQE, University of Siegen, NRW, Germany

6. P. Haring Bolívar

   University of Siegen

   Affiliation as printed

   HQE, University of Siegen, NRW, Germany