January 01, 2020 article Open access Dimensional artefacts to achieve metrological traceability in advanced manufacturing CIRP Annals DOI: 10.1016/j.cirp.2020.05.009 Full text (OA) OpenAlex Authors 0 Author list not loaded yet. Cited by 1 stored of 94 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Sinogram interpretability based CT artefact reduction for multi-material workpieces 2022 Nondestructive Testing And Evaluation article Engineering Advanced X-ray and CT Imaging Open access 2 citations 1 result References 0