Sinogram interpretability based CT artefact reduction for multi-material workpieces
Nondestructive Testing And Evaluation, vol. 37, pp. 679–691
Abstract
Computed tomography (CT) is a technology for the simultaneous inspection of internal and external features of workpieces. However, beam hardening and scattered radiation artefacts caused by the different material densities and atomic numbers commonly confound CT measurements of multi-material workpieces. Multispectral CT (MSP CT) measurements reduce artefacts by combining multiple CT volumes performed with different x-ray spectra. However, all known simulation-based CT parameter optimisation approaches for industrial applications consider only the single-spectrum case. This paper investigates the CT radon space, focusing on sinogram interpretability. Multispectral CT x-ray spectra can be determined by defining and analysing sinogram areas corresponding to equivalent volume slice artefacts. Validation indicates that the two MSP CT spectra recommended via a proposed CT simulation considering critical sinogram areas cause an artefact reduction. Results are quantified by a standard deviation reduction of measured geometrical features.
Authors 4
-
Affiliation as printed
WZL , RWTH Aachen University, Chair of Production Metrology and Quality Management, Aachen, Germany
-
Affiliation as printed
WZL , RWTH Aachen University, Chair of Production Metrology and Quality Management, Aachen, Germany
-
Affiliation as printed
WZL , RWTH Aachen University, Chair of Production Metrology and Quality Management, Aachen, Germany
-
Robert Heinrich Schmitt Aachen Fraunhofer Institute for Production Technology IPT Chair of Production Metrology and Quality Management Department of Production Metrology and Quality Management
RWTH Aachen University · Fraunhofer Institute for Production Technology IPT
Affiliation as printed
Department of Production Metrology and Quality Management, Fraunhofer Institute for Production Technology IPT, Aachen, Germany
WZL , RWTH Aachen University, Chair of Production Metrology and Quality Management, Aachen, Germany
Cited by 2 stored of 2
2 results
No patents citing this paper on Lens.org (checked 2026-10-06).
References 21
-
W3048111397details pending0citations
-
W2136281361details pending0citations
-
W2319295333details pending0citations
-
W1998331485details pending0citations
-
W2055138517details pending0citations
-
W2105881826details pending0citations
-
W2129879687details pending0citations
-
W2393367083details pending0citations
-
W2593491586details pending0citations
-
W2621170419details pending0citations
-
W2803694605details pending0citations
-
W2893751902details pending0citations
-
W2922017029details pending0citations
-
W2947698616details pending0citations
-
W2971657722details pending0citations
-
W2998755364details pending0citations
-
W3035413297details pending0citations
-
W3094011173details pending0citations
-
W3144878655details pending0citations