Device-Aware Test: A New Test Approach Towards DPPB Level

• A Combined Strategy for Testing RRAMs After Manufacturing and During Lifetime

  2025 IEEE Latin American Test Symposium (LATS) conference-paper Computer Science VLSI and Analog Circuit Testing

  1

  citations
• Lifecycle Management of Emerging Memories

  2024 Proceedings/Proceedings - European Test Workshop conference-paper Engineering Advanced Memory and Neural Computing

  5

  citations
• Analyzing the Use of Temperature to Facilitate Fault Propagation in ReRAMs

  2024 IEEE Latin American Test Symposium (LATS) conference-paper Computer Science VLSI and Analog Circuit Testing

  2

  citations
• A DfT Strategy for Guaranteeing ReRAM’s Quality after Manufacturing

  2024 Journal of Electronic Testing article Computer Science VLSI and Analog Circuit Testing Open access

  10

  citations
• Characterization and Test of Intermittent Over RESET in RRAMs

  2023 Proceedings - Asian Test Symposium/Proceedings conference-paper Computer Science VLSI and Analog Circuit Testing Open access

  2

  citations
• Exploring an On-Chip Sensor to Detect Unique Faults in RRAMs

  2022 IEEE Latin American Test Symposium (LATS) conference-paper Computer Science VLSI and Analog Circuit Testing Open access

  7

  citations
• A DfT Strategy for Detecting Emerging Faults in RRAMs

  2022 IFIP advances in information and communication technology conference-paper Computer Science VLSI and Analog Circuit Testing Open access

  3

  citations
• Validating a DFT Strategy’s Detection Capability regarding Emerging Faults in RRAMs

  2021 IFIP/IEEE International Conference on Very Large Scale Integration conference-paper Computer Science VLSI and Analog Circuit Testing cited by 5 patents

  14

  citations
• Review of Manufacturing Process Defects and Their Effects on Memristive Devices

  2021 Journal of Electronic Testing article Engineering Advanced Memory and Neural Computing Open access

  33

  citations
• Improving the Detection of Undefined State Faults in FinFET SRAMs

  2021 International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) conference-paper Computer Science VLSI and Analog Circuit Testing Open access

  1

  citations
• Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMs

  2021 Proceedings/Proceedings - European Test Workshop conference-paper Computer Science VLSI and Analog Circuit Testing Open access

  6

  citations
• Hard-to-Detect Fault Analysis in FinFET SRAMs

  2021 IEEE Transactions on Very Large Scale Integration (VLSI) Systems article Computer Science VLSI and Analog Circuit Testing Open access

  15

  citations

12 results