Optimized IGBT Turn-Off Switching Performance Using the Full Device Safe Operating Area

• High dv/dt Testing of Coil Winding Insulation Systems for Wide-Bandgap Applications

  2023 International Conference on Power Electronics and ECCE Asia (ICPE-ECCE Asia) conference-paper Materials Science High voltage insulation and dielectric phenomena

  2

  citations
• Balancing Unequal Temperature Distributions of Parallel-Connected SiC MOSFETs Using an Intelligent Gate Driver

  2021 IEEE Workshop on Wide Bandgap Power Devices and Applications conference-paper Engineering Silicon Carbide Semiconductor Technologies Open access

  8

  citations
• SiC-Based dv/dt Generator for Insulation Testing with Fast and Adjustable Switching Transients

  2021 IEEE Workshop on Wide Bandgap Power Devices and Applications conference-paper Engineering Silicon Carbide Semiconductor Technologies

  5

  citations
• Balancing the Switching Losses of Paralleled SiC MOSFETs Using a Stepwise Gate Driver

  2021 IEEE Energy Conversion Congress and Exposition (ECCE) conference-paper Engineering Silicon Carbide Semiconductor Technologies Open access

  9

  citations
• Intelligent Gate Drivers for Future Power Converters

  2021 IEEE Transactions on Power Electronics article Engineering Silicon Carbide Semiconductor Technologies cited by 2 patents

  104

  citations
• Next Generation Monitoring of SiC mosfets Via Spectral Electroluminescence Sensing

  2021 IEEE Transactions on Industry Applications article Engineering Silicon Carbide Semiconductor Technologies cited by 3 patents

  27

  citations
• Ultra-Fast Short-Circuit Detection for SiC-MOSFETs Using DC-Link Voltage Monitoring

  2020 IEEE International Symposium on Power Electronics for Distributed Generation Systems (PEDG) conference-paper Engineering Silicon Carbide Semiconductor Technologies cited by 6 patents

  2

  citations
• Closed-Loop dv/dt Control of SiC MOSFETs Yielding Minimal Losses and Machine Degradation

  2020 IEEE Transportation Electrification Conference & Expo (ITEC) conference-paper Engineering Silicon Carbide Semiconductor Technologies

  11

  citations
• Toward an In-Depth Understanding of the Commutation Processes in a SiC MOSFET Switching Cell Including Parasitic Elements

  2020 IEEE Transactions on Industry Applications article Engineering Silicon Carbide Semiconductor Technologies Open access

  42

  citations

9 results