December 01, 2017 conference-paper RTN based oxygen vacancy probing method for Ox-RRAM reliability characterization and its application in tail bits DOI: 10.1109/iedm.2017.8268435 OpenAlex Authors 0 Author list not loaded yet. Cited by 3 stored of 28 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Effect of electron conduction on the read noise characteristics in ReRAM devices 2022 APL Materials article Engineering Advanced Memory and Neural Computing Open access 24 citations Reliability aspects of binary vector-matrix-multiplications using ReRAM devices 2022 Neuromorphic Computing and Engineering article Engineering Advanced Memory and Neural Computing Open access 35 citations HRS Instability in Oxide-Based Bipolar Resistive Switching Cells 2020 IEEE Transactions on Electron Devices article Engineering Advanced Memory and Neural Computing 57 citations 3 results References 0