May 16, 2008 article High-k-oxide/silicon interfaces characterized by capacitance frequency spectroscopy Solid-State Electronics DOI: 10.1016/j.sse.2008.04.005 OpenAlex Authors 0 Author list not loaded yet. Cited by 1 stored of 35 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Multiparameter Admittance Spectroscopy for Investigating Defects in MoS₂ Thin-Film MOSFETs 2025 IEEE Transactions on Electron Devices article Materials Science 2D Materials and Applications Open access 1 citations 1 result References 0