June 01, 2017 conference-paper Open access Quantitative Evaluation of Hard X-ray Damage to Biological Samples using EUV Ptychography Journal of Physics Conference Series DOI: 10.1088/1742-6596/849/1/012034 Full text (OA) OpenAlex Authors 0 Author list not loaded yet. Cited by 2 stored of 5 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Characterisation of engineered defects in extreme ultraviolet mirror substrates using lab-scale extreme ultraviolet reflection ptychography 2023 Ultramicroscopy article Physics and Astronomy Advanced X-ray Imaging Techniques Open access 15 citations Quantitative and correlative extreme ultraviolet coherent imaging of mouse hippocampal neurons at high resolution 2020 Science Advances article Physics and Astronomy Advanced X-ray Imaging Techniques Open access cited by 2 patents 70 citations 2 results References 0