March 01, 2017 conference-paper Memristor for computing: Myth or reality? Design, Automation, and Test in Europe DOI: 10.23919/date.2017.7927083 OpenAlex Authors 0 Author list not loaded yet. Cited by 13 stored of 121 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access A Combined Strategy for Testing RRAMs After Manufacturing and During Lifetime 2025 IEEE Latin American Test Symposium (LATS) conference-paper Computer Science VLSI and Analog Circuit Testing 1 citations The show must go on: a reliability assessment platform for resistive random access memory crossbars 2025 Philosophical Transactions of the Royal Society A Mathematical Physical and Engineering Sciences article Engineering Advanced Memory and Neural Computing 1 citations Lifecycle Management of RRAMs: Quality and Reliability 2024 conference-paper Engineering Advanced Memory and Neural Computing 1 citations Spiking Neural Networks for Signal Classification with Digital and Analog Neuromorphic Systems: A Comparative Study 2024 conference-paper Engineering Advanced Memory and Neural Computing 0 citations Lifecycle Management of Emerging Memories 2024 Proceedings/Proceedings - European Test Workshop conference-paper Engineering Advanced Memory and Neural Computing 5 citations Analyzing the Use of Temperature to Facilitate Fault Propagation in ReRAMs 2024 IEEE Latin American Test Symposium (LATS) conference-paper Computer Science VLSI and Analog Circuit Testing 2 citations A DfT Strategy for Guaranteeing ReRAM’s Quality after Manufacturing 2024 Journal of Electronic Testing article Computer Science VLSI and Analog Circuit Testing Open access 10 citations Devices and Architectures for Efficient Computing In-Memory (CIM) Design 2023 Lecture notes in computer science conference-paper Engineering Advanced Memory and Neural Computing 1 citations Exploring an On-Chip Sensor to Detect Unique Faults in RRAMs 2022 IEEE Latin American Test Symposium (LATS) conference-paper Computer Science VLSI and Analog Circuit Testing Open access 7 citations A Voltage-Controlled, Oscillation-Based ADC Design for Computation-in-Memory Architectures Using Emerging ReRAMs 2022 ACM Journal on Emerging Technologies in Computing Systems article Engineering Advanced Memory and Neural Computing cited by 10 patents 21 citations A DfT Strategy for Detecting Emerging Faults in RRAMs 2022 IFIP advances in information and communication technology conference-paper Computer Science VLSI and Analog Circuit Testing Open access 3 citations Validating a DFT Strategy’s Detection Capability regarding Emerging Faults in RRAMs 2021 IFIP/IEEE International Conference on Very Large Scale Integration conference-paper Computer Science VLSI and Analog Circuit Testing cited by 5 patents 14 citations Review of Manufacturing Process Defects and Their Effects on Memristive Devices 2021 Journal of Electronic Testing article Engineering Advanced Memory and Neural Computing Open access 33 citations 13 results References 0