March 07, 2017 article MEMRISTOR BASED MEMORIES: DEFECTS, TESTING, AND TESTABILITY TECHNIQUES Far East Journal of Electronics and Communications DOI: 10.17654/ec017010105 OpenAlex Authors 0 Author list not loaded yet. Cited by 1 stored of 10 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Related Work 2026 Synthesis lectures on engineering, science, and technology book-chapter Engineering Advanced Memory and Neural Computing 0 citations 1 result References 0