February 20, 2017 article Open access Correlating Atom Probe Tomography with Atomic-Resolved Scanning Transmission Electron Microscopy: Example of Segregation at Silicon Grain Boundaries Microscopy and Microanalysis DOI: 10.1017/s1431927617000034 Full text (OA) OpenAlex Authors 0 Author list not loaded yet. Cited by 5 stored of 34 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access The Physics of Twin Boundary Termination in Cu(In, Ga)Se2 Absorbers 2023 Solar RRL article Engineering Chalcogenide Semiconductor Thin Films Open access 4 citations Correlative microscopy and techniques with atom probe tomography: Opportunities in materials science 2022 MRS Bulletin article Engineering Advanced Materials Characterization Techniques Open access 15 citations Quantifying lithium enrichment at grain boundaries in Li7La3Zr2O12 solid electrolyte by correlative microscopy 2022 Journal of Power Sources article Engineering Advanced Battery Materials and Technologies Open access 36 citations Grain Boundaries in Cu(In, Ga)Se 2 : A Review of Composition–Electronic Property Relationships by Atom Probe Tomography and Correlative Microscopy 2021 Advanced Functional Materials article Engineering Chalcogenide Semiconductor Thin Films Open access 54 citations Effect of Cd diffusion on the electrical properties of the Cu(In,Ga)Se2 thin-film solar cell 2021 Solar Energy Materials and Solar Cells article Engineering Chalcogenide Semiconductor Thin Films 18 citations 5 results References 0