January 01, 2016 book-chapter Correlative Microscopy by (Scanning) Transmission Electron Microscopy and Atom Probe Tomography Elsevier eBooks DOI: 10.1016/b978-0-12-804647-0.00010-3 OpenAlex Authors 0 Author list not loaded yet. Cited by 2 stored of 6 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Correlative microscopy and techniques with atom probe tomography: Opportunities in materials science 2022 MRS Bulletin article Engineering Advanced Materials Characterization Techniques Open access 15 citations Effect of Cd diffusion on the electrical properties of the Cu(In,Ga)Se2 thin-film solar cell 2021 Solar Energy Materials and Solar Cells article Engineering Chalcogenide Semiconductor Thin Films 18 citations 2 results References 0