June 25, 2007 review Atom Probe Tomography of Electronic Materials Annual Review of Materials Research DOI: 10.1146/annurev.matsci.37.052506.084239 OpenAlex Authors 0 Author list not loaded yet. Cited by 5 stored of 226 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Atom Probe Tomography: a Local Probe for Chemical Bonds in Solids 2024 Advanced Materials article Engineering Advanced Materials Characterization Techniques Open access 33 citations Correlative microscopy and techniques with atom probe tomography: Opportunities in materials science 2022 MRS Bulletin article Engineering Advanced Materials Characterization Techniques Open access 15 citations Grain Boundaries in Cu(In, Ga)Se 2 : A Review of Composition–Electronic Property Relationships by Atom Probe Tomography and Correlative Microscopy 2021 Advanced Functional Materials article Engineering Chalcogenide Semiconductor Thin Films Open access 54 citations Hidden role of intrinsic Sb-rich nano-precipitates for high-performance Bi2-Sb Te3 thermoelectric alloys 2021 Acta Materialia article Materials Science Advanced Thermoelectric Materials and Devices 38 citations Revealing the interface nature of ZDDP tribofilm by X-ray photoelectron spectroscopy and atom probe tomography 2020 Industrial Lubrication and Tribology article Engineering Lubricants and Their Additives Open access 26 citations 5 results References 0