November 08, 2004 conference-paper Dynamic read destructive fault in embedded-SRAMs: analysis and march test solution DOI: 10.1109/etsym.2004.1347645 OpenAlex Authors 0 Author list not loaded yet. Cited by 2 stored of 72 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Background 2025 Synthesis lectures on engineering, science, and technology book-chapter Engineering Advanced Memory and Neural Computing 0 citations Hard-to-Detect Fault Analysis in FinFET SRAMs 2021 IEEE Transactions on Very Large Scale Integration (VLSI) Systems article Computer Science VLSI and Analog Circuit Testing Open access 15 citations 2 results References 0